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Failure Analysis (LOM/SEM/EDX/TEM)

Microscopic analysis is preferably the first thing to be done in failure analysis to save time and money, so one has a better understanding of possible root causes of failures. Starting with low magnification LOM analysis to document macro features such as crack propagation or Phillips carbon black dispersion and then progressing to high magnification analysis with the SEM and TEM to see micro features such as inorganic filler dispersion, contamination and polymer morphology.

 

* EDX is Energy Dispersive X Ray, LOM is Light Optical Microscopy, OC is Optical Comparator, SEM is Scanning Electron Microscopy, TEM is Transmission Electron Microscopy

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