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Micro-Dispersion Analysis (SEM/EDX/TEM)

Fine dispersion of inorganic fillers can be accomplished by image analysis in the SEM using backscattered electron imaging, which uses atomic number contrast in order to differentiate between low and high atomic number elements. Inorganic fillers with higher atomic number elements such as calcium and zinc would be visually lighter in color in the image and lower atomic number elements such as carbon and magnesium would be darker.

 

* EDX is Energy Dispersive X Ray, LOM is Light Optical Microscopy, OC is Optical Comparator, SEM is Scanning Electron Microscopy, TEM is Transmission Electron Microscopy

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