Surface features of samples can be obtained using the light microscope (LOM) or the SEM and features such as surface roughness and crack propagation can be seen. Discoloration problems can be detected in the LOM and sometimes identified elementally by using atomic number contrast in the SEM. Atomic number contrast uses the backscattered electron detector, which can determine differences in relative atomic number with high atomic number elements (for example, iron or lead) being lighter in color and lower atomic number elements being darker (carbon, silicon, etc.) depending on the matrix of the sample. Specific elements can then be identified using the IXRF Systems - EDS2004 energy dispersive X-ray system (EDX). High-resolution secondary electron SEM images can also be obtained to further characterize the sample.

* EDX is Energy Dispersive X Ray, LOM is Light Optical Microscopy, OC is Optical Comparator, SEM is Scanning Electron Microscopy, TEM is Transmission Electron Microscopy