Microscopy techniques are used to produce visible images of polymer micro-structures or details that are too small to be seen by the human eye.

There are three main types of microscopy: Optical, Electron and Scanning Probe. ARDL utilizes Optical and Electron microscopy including Light Optical Microscopy (LOM), Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM).

Energy Dispersive X-ray (EDX) detects elements within a sample using X-rays generated by the SEM.  Optical Comparator (OC) can be used for micromeasurements on parts to make sure they are in specification.

ARDL has a light element detector on the SEM so that elements above Boron in the periodic table can be detected.

  • Elemental Dot Maps from EDX spectra can be used to show the locations of the elements detected.
  • Carbon Black Testing/Carbon Black Typing (TEM)
  • Coating & Film Thickness (LOM/OC/SEM/EDX/TEM)
  • Dimensional Analysis (LOM/OC)
  • Dispersion Analysis (LOM)
  • Elemental Analysis & Multi-Element Dot Mapping (EDX)
  • Failure Analysis (LOM/SEM/EDX/TEM)
  • Foam Cell Size (LOM)
  • Internal Structure Features (LOM/SEM/TEM)
  • Metal-to-Rubber Bonding (SEM/EDX)
  • Micro-Dispersion Analysis (SEM/EDX/TEM)
  • Particle Size & Particle Size Distribution (LOM/SEM/TEM)
  • Polymer Blend Morphology (LOM/TEM)
  • Room Temperature & Cryogenic Microtoming (LOM/TEM)
  • Surface Analysis (LOM/SEM)

* EDX is Energy Dispersive X-ray, LOM is Light Optical Microscopy, OC is Optical Comparator, SEM is Scanning Electron Microscopy, TEM is Transmission Electron Microscopy

Available Methods

Elemental Analysis - EDX

ARDL Method for Elemental Analysis by Energy Dispersive X-Ray (EDX)

ARDL 3804

Semi-Quantitative Elemental Analysis - SEM/EDX

ARDL Method for Semi-Quantitative Analysis by SEM/EDX

ARDL 3813