Microscopy techniques are used to produce visible images of polymer micro-structures or details that are too small to be seen by the human eye.
There are three main types of microscopy: Optical, Electron and Scanning Probe. ARDL utilizes Optical and Electron microscopy including Light Optical Microscopy (LOM), Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM).
Energy Dispersive X-ray (EDX) detects elements within a sample using X-rays generated by the SEM. Optical Comparator (OC) can be used for micromeasurements on parts to make sure they are in specification.
ARDL has a light element detector on the SEM so that elements above Boron in the periodic table can be detected.
- Elemental Dot Maps from EDX spectra can be used to show the locations of the elements detected.
- Carbon Black Testing/Carbon Black Typing (TEM)
- Coating & Film Thickness (LOM/OC/SEM/EDX/TEM)
- Dimensional Analysis (LOM/OC)
- Dispersion Analysis (LOM)
- Elemental Analysis & Multi-Element Dot Mapping (EDX)
- Failure Analysis (LOM/SEM/EDX/TEM)
- Foam Cell Size (LOM)
- Internal Structure Features (LOM/SEM/TEM)
- Metal-to-Rubber Bonding (SEM/EDX)
- Micro-Dispersion Analysis (SEM/EDX/TEM)
- Particle Size & Particle Size Distribution (LOM/SEM/TEM)
- Polymer Blend Morphology (LOM/TEM)
- Room Temperature & Cryogenic Microtoming (LOM/TEM)
- Surface Analysis (LOM/SEM)
* EDX is Energy Dispersive X-ray, LOM is Light Optical Microscopy, OC is Optical Comparator, SEM is Scanning Electron Microscopy, TEM is Transmission Electron Microscopy
Elemental Analysis - EDX
ARDL Method for Elemental Analysis by Energy Dispersive X-Ray (EDX)ARDL 3804
Semi-Quantitative Elemental Analysis - SEM/EDX
ARDL Method for Semi-Quantitative Analysis by SEM/EDXARDL 3813